IDI / Smiths Interconnect C Series Probes

Smiths Interconnect / IDI C Series Probes ensure a reliable, rugged connection in harsh environments. Standard pins offered in custom configurations meet the exact footprint of the user's application. Ground, power, and signal options are available in 6mm and 4mm lengths. These probes are ideal for RF, high-speed, and mixed-signal connectors. Ground contacts mate first and break last to support hot swap applications. The design supports increased current carrying capacity. The C Series Connector Probes are offered in surface-mount, through-hole, and solder-cup termination options.

Features

  • Ensures a reliable, rugged connection in harsh environments
  • Ground, power, and signal options available in 6mm and 4mm lengths
  • Ideal for RF, high-speed, and mixed-signal connectors
  • Surface-mount, through-hole, or solder-cup termination
View Results ( 15 ) Page
零件編號 規格書 說明 長度 行程 系列
CG-2.5-6-SC-BB CG-2.5-6-SC-BB 規格書 接觸探頭 接觸探頭 11 mm 2.5 mm C Series Bias Ball
CG-2.5-6-TH CG-2.5-6-TH 規格書 接觸探頭 Connector Probes 11 mm 2.5 mm C
CP-2.5-4-TH CP-2.5-4-TH 規格書 接觸探頭 Connector Probes 7.2 mm 0.71 mm C
CP-2.5-6-TH 接觸探頭 Connector Probes 10.5 mm 2 mm C
CG-2.5-4-SC CG-2.5-4-SC 規格書 接觸探頭 Connector Probes 7.5 mm 1 mm C
CG-2.5-6-SM CG-2.5-6-SM 規格書 接觸探頭 Connector Probes 8.5 mm 2.5 mm C
CP-2.5-6-SC CP-2.5-6-SC 規格書 接觸探頭 Connector Probes 10.5 mm 2 mm C
CP-2.5-6-SM CP-2.5-6-SM 規格書 接觸探頭 Connector Probes 8 mm 2 mm C
CG-2.5-4-TH CG-2.5-4-TH 規格書 接觸探頭 Connector Probes 7.5 mm 1 mm C
CG-2.5-6-SC CG-2.5-6-SC 規格書 接觸探頭 Connector Probes 11 mm 2.5 mm C
發佈日期: 2011-07-28 | 更新日期: 2022-03-11