Texas Instruments SN74ACT3G97/Q1 Dual Configurable Data Flip-Flops
Texas Instruments SN74ACT3G97/Q1 Dual Configurable Data Flip-Flops incorporate three independent '97 function configurable logic gates with Schmitt trigger inputs. Each gate of the TI SN74ACT3G97/Q1 dual configurable data flip-flop can be set to perform a wide range of one- or two-input logic functions by tying unused inputs to either the supply voltage or ground.
The SN74ACT3G97-Q1 devices are AEC-Q100 qualified for automotive applications.
Features
- AEC-Q100 qualified for automotive applications:
- Device temperature grade 1 : -40° to +125°C
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B
- Available in a wettable flank QFN package
- Operating voltage range of 4.5V to 5.5V
- TTL-compatible Schmitt-trigger inputs support slow and noisy input signals
- Continuous ±24mA output drive at 5V
- Supports up to ±75mA output drive at 5V in short bursts
- Drives 50Q transmission lines
- Fast operation with a delay of 12.2ns max
Applications
- Combine power good signals
- Combine enable signals
- Eliminate slow or noisy input signals
- Synchronize inverted clock inputs
- Debounce a switch
- Use fewer inputs to monitor error signals
- Data selection
- Multiplexing
Datasheets
Logic Diagram (Positive Logic)
Dev Tools
Texas Instruments 14-24-LOGIC-EVM Logic Evaluation Module (EVM)
Generic evaluation module developed to support any TI logic leaded device in a 14 to 24 pin count.
Texas Instruments 14-24-NL-LOGIC-EVM Logic Evaluation Module (EVM)
Supports any logic or translation device in a BQA, BQB, RGY (14-24 pin), RSV, RJW, or RHL package.
發佈日期: 2026-01-07
| 更新日期: 2026-01-20