EVAL-CN0407-SDPZ

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Mouser 編號：

584-EVAL-CN0407-SDPZ

製造商編號：

EVAL-CN0407-SDPZ

製造商：

Analog Devices

說明：

放大器 IC 開發工具 FemtoAmp Measurement CFTL Board

規格書:

EVAL-CN0407-SDPZ 規格書 (PDF)

更多資訊

瞭解更多關於Analog Devices EVAL-CN0407-SDPZ的資訊

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商品屬性	屬性值	選擇屬性
製造商:	Analog Devices Inc.
產品類型:	放大器 IC 開發工具
付運限制：	Mouser目前不在您的地區出售本產品。
RoHS:
產品:	Evaluation Boards
類型:	Operational Amplifiers
評估工具:	ADA4530-1
工作電源電壓:	9 V
封裝:	Bulk
品牌:	Analog Devices
描述/功能:	Ultrahigh sensitivity femtoampere measurement platform
最高工作溫度:	+ 125 C
最低工作溫度:	- 40 C
產品類型:	Amplifier IC Development Tools
系列:	ADA4530
原廠包裝數量:	1
子類別:	Development Tools
每件重量:	667.345 g

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篩選文檔:

規格書

EVAL-CN0407-SDPZ 規格書 (PDF)

RoHS Certificate (PDF)

CNHTS:: 8543709990
CAHTS:: 8473302000
USHTS:: 8473301180
TARIC:: 8473302000
MXHTS:: 8473300401
ECCN:: EAR99

EVAL-CN0407-SDPZ Circuit Evaluation Board

Analog Devices Inc. EVAL-CN0407-SDPZ Circuit Evaluation Board helps designers evaluate the CN-0407 Ultra-high Sensitivity Femtoampere Measurement Platform. The EVAL-CN0407-SDPZ from Analog Devices provides a reference design for real-world application by partitioning the system into a low-leakage mezzanine board (EVAL-CN0407-1-SDPZ) and a data acquisition board (EVAL-CN0407-2-SDPZ). The mezzanine board (EVAL-CN0407-1-SDPZ) includes the electrometer-grade ADA4530-1 Amplifier for input signal conditioning. The default amplifier configuration is in the transimpedance mode with a 10GΩ glass resistor and a metal shield that prevents leakage current from entering any of the high impedance paths on the board. Additionally, the mezzanine board includes an unpopulated resistor and capacitor pads to enable prototyping with surface-mount feedback resistors as well as other input configurations. The data acquisition board (EVAL-CN0407-2-SDPZ) features uses an AD7172-2 24-bit Σ-Δ ADC. Powered by a single 9Vdc supply, the onboard supply generates all necessary voltages required to power both boards. The board connects to a PC through the SDP-S board and uses digital isolation to prevent noise from the USB bus or ground loops from degrading low current measurements.