TMDSEMU200-U

TMDSEMU200-U XDS200 USB Debug Probe

Texas Instruments TMDSEMU200-U XDS200 USB Debug Probe is the latest family of JTAG debug probes (emulators) for TI processors. Designed to deliver good performance and the most common features that place it between the low-cost XDS100 and the high performance XDS560v2, the XDS200 is the balanced solution to debug TI microcontrollers, processors and wireless devices. The XDS200 is designed to replace the aging XDS510 family of JTAG debuggers with higher JTAG data throughput, added support for ARM Serial Wire debug modes and reduced cost. All XDS200 variants feature a standard TI 20-pin connector as the primary JTAG connectivity to the target. In addition to that, all variants also feature modular target configuration adapters for TI and ARM standard JTAG headers. The XDS200 supports the traditional IEEE1149.1 (JTAG), IEEE1149.7 (cJTAG) as well as ARM's Serial Wire Debug (SWD) and Serial Wire Output (SWO) and operates with interface levels from +1.5V to 4.1V.